As a PhD student with the Centre for Electronic Imaging, Charles has been working towards the development of a soft X-ray CMOS image sensor.
Non-ionizing radiation effects in a soft X-ray CMOS image sensor (2024-07)
Townsend-Rose, Charles; Buggey, Thomas; Ivory, James; Dazzazi, Imane; Stefanov, Konstantin and Hall, David
Journal of Astronomical Telescopes, Instruments, and Systems, 10, Article 36002(3)
Ionising radiation effects in a soft X-ray CMOS image sensor (2024-02)
Townsend-Rose, Charles; Buggey, Thomas; Ivory, James; Stefanov, Konstantin D. and Holland, Andrew D.
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1059, Article 169011
Electro-optical characterization of a CMOS image sensor optimized for soft x-ray astronomy (2023-10-14)
Townsend-Rose, Charles; Buggey, Thomas; Ivory, James; Stefanov, Konstantin D.; Jones, Lawrence; Hetherington, Oliver; Holland, Andrew D. and Prod’homme, Thibaut
Journal of Astronomical Telescopes, Instruments, and Systems, 9, Article 46001(4)
Non-ionising radiation effects in a soft X-ray CMOS image sensor (2024)
Townsend-Rose, Charles; Buggey, Thomas W.; Ivory, James M.; Dazzazi, Imane; Stefanov, Konstantin D. and Hall, David J.
In : SPIE Astronomical Telescopes + Instrumentation, 2024 (16-22 Jun 2024, Yokohama, Japan)
Characterization, quantum efficiency, and radiation hardness of a CMOS image sensor optimized for soft x-ray astronomy (2023)
Townsend-Rose, Charles; Buggey, Thomas; Ivory, James; Stefanov, Konstantin D.; Jones, Lawrence; Hetherington, Oliver and Holland, Andrew D.
In : SPIE Optical Engineering + Applications (20-24 Aug 2023, San Diego, California, United States)
A CMOS image sensor for soft x-ray astronomy (2022)
Stefanov, Konstantin; Townsend-Rose, Charles; Buggey, Thomas; Ivory, James; Hetherington, Oliver; Holland, Andrew; Heymes, Julian; Pratlong, Jérôme; Tsiolis, Georgios; Morris, David; Minoglou, Kyriaki; Prod'homme, Thibaut and Soman, Matthew
In : SPIE Astronomical Telescopes + Instrumentation (17-23 Jul 2022, Montreal, Canada)